Aeris – a new benchtop X-ray powder diffractometer
PANalytical announces the launch of Aeris, their new X-ray powder diffraction (XRD) benchtop instrument. Ease of use and maximum benefits for the user are the key aspects of this newly developed system, which provides fast and precise phase information of the materials analyzed.
Aeris is accessible for everyone – its built-in touch screen with the intuitive interface directly displays all results. At the same time Aeris is designed for low cost of ownership – it only requires a single-phase power outlet and needs neither cooling water nor compressed air. Nevertheless, as the instrument incorporates many technologies proven on PANalytical’s high-end systems, its performance is exceeding typical benchtop X-ray diffractometer performance. Data quality and speed of data acquisition have so far only been observed on full-power systems. Additionally, Aeris is the first benchtop XRD system that is fully automatable and can easily be incorporated into industrial production control.
As many industries have specific demands for their materials’ analysis, Aeris editions are available, which have been tailored to the specific needs of the cement industry. They provide fast and precise mineralogical phase information, which can be used for control and optimization of the production process.
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